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Search for "conducting atomic force microscopy (C-AFM)" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.
Templating effect of single-layer graphene supported by an insulating substrate on the molecular orientation of lead phthalocyanine
Beilstein J. Nanotechnol. 2020, 11, 814–820, doi:10.3762/bjnano.11.66
- specific device applications. Keywords: conducting atomic force microscopy (C-AFM); lead phthalocyanine (PbPc); molecular orientation; single-layer graphene; substrate effect; two-dimensional grazing incidence X-ray diffraction (2D-GIXRD); Introduction Organic semiconductors have been extensively used in
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